課程資訊
課程名稱
高科技產業材料應用與分析
MATERIALS APPLICATIONS AND ANALYSIS IN HIGH-TECH INDUSTRY 
開課學期
98-1 
授課對象
工學院  應用力學研究所  
授課教師
陳建彰 
課號
AM7058 
課程識別碼
543EM5240 
班次
 
學分
全/半年
半年 
必/選修
選修 
上課時間
星期五6,7,8(13:20~16:20) 
上課地點
應107 
備註
本課程以英語授課。
總人數上限:35人 
Ceiba 課程網頁
http://ceiba.ntu.edu.tw/981MAT_INDUSTRY 
課程簡介影片
 
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課程概述

The detailed content of this course will be updated every year. In this semister, the content will emphasize on the material fundamentals, analysis tools, and the material selection for designs. 

課程目標
In this course, students will learn materials fundamentals and analysis tools. The target is to help students build up insights for future materials application, to train students using the materials R&D to improve the competitiveness in high-tech industries. 
課程要求
General physics,
General chemistry,
Engineering Mathematics 
預期每週課後學習時數
 
Office Hours
 
指定閱讀
☆★ Principles of Electronic Materials and Devices, by S. O. Kasap, McGraw-Hill 2005.
☆★ Materials Selection in Mechanical Design, by Michael F. Ashby, Elsevier 2003.
☆ Principles of instrumental analysis, by D. A. Skoog, F. J. Holler, S. R. Crouch, Belmont, CA: Thomson Brooks/Cole, 2007. 
參考書目
☆★ Principles of Electronic Materials and Devices, by S. O. Kasap, McGraw-
Hill 2005.
☆★ Materials Selection in Mechanical Design, by Michael F. Ashby, Elsevier
2003.
☆Optoelectronics and Photonics, by S. O. Kasap, McGraw-Hill 2001.
☆ Engineering Materials 1: An Introduction to Properties, Applications and
Design, by Michael F. Ashby and David R. H. Jones, Elsevier 2005.
☆ Scanning Electron Microscopy and X-ray Microanalysis, R. E. Lee, Prentice-
Hall, 1993.
☆ Elements of X-ray Diffraction, B. D. Cullity, Addison Wesley.
☆ Principles of instrumental analysis, by D. A. Skoog, F. J. Holler, S. R.
Crouch, Belmont, CA: Thomson Brooks/Cole, 2007.
Understanding Materials Science, Rolf E. Hummel, Springer, 1997.
Materials – Engineering, Science, Processing and Design, by M. Ashby, H.
Shercliff, and D. Cebon, Elsevier 2007.
Engineering Materials 2: An Introduction to Microstructures, Processing and
Design, by Michael F. Ashby and David R. H. Jones, Elsevier 2005.
Instrumental Methods of Analysis, H. H. Willard, L. L. Merritt Jr, J. A. Dean,
F. A. Settle Jr., Wadsworth.
Surface analysis techniques and applications, edt by W. Neagle, D. R. Randell,
Cambridge, Royal Society of Chemistry, 1990.
An introduction to surface analysis by XPS and AES, by J. F. Watts and J.
Wolstenholme, New York: J. Wiley, 2003.
 
評量方式
(僅供參考)
   
課程進度
週次
日期
單元主題
Week 1
9/18  Materials Fundamentals: Introduction 
Week 2
9/25  Materials Fundamentals: Electrical and Thermal Conduction 
Week 3
10/02  Materials Fundamentals: Elementary Quantum Physics 
Week 4
10/09  Materials Fundamentals: Modern Theory of Solids 
Week 5
10/16  Materials Fundamentals: Semiconductors 
Week 6
10/23  Materials Fundamentals: Semiconductor Devices 
Week 7
10/30  Materials Fundamentals: Semiconductor Devices 
Week 8
11/06  Materials Fundamentals: Semiconductor Devices

Materials Fundamentals: Dielectric Materials and Insulation 
Week 9
11/13  Materials Fundamentals: Magnetic Properties and Superconductivity
 
Week 10
11/20  Materials Fundamentals: Optical Properties of Materials 
Week 11
11/27  Materials analysis: Microstructure analysis 
Week 12
12/04  Fall MRS 
Week 13
12/11  OPT 
Week 14
12/18  Materials analysis: Surface analysis 
Week 15
12/25  Final oral reports 
Week 17
1/08  Materials analysis: Chemical analysis